By Rik Brydson

ISBN-10: 0470518510

ISBN-13: 9780470518519

The e-book is anxious with the speculation, history, and sensible use of transmission electron microscopes with lens correctors that could right the results of round aberration. The booklet additionally covers a comparability with aberration correction within the TEM and purposes of analytical aberration corrected STEM in fabrics technology and biology. This publication is vital for microscopists interested by nanoscale and fabrics microanalysis specifically these utilizing scanning transmission electron microscopy, and similar analytical options akin to electron diffraction x-ray spectrometry (EDXS) and electron strength loss spectroscopy (EELS).

Show description

Read Online or Download Aberration-corrected Analytical Electron Microscopy PDF

Similar instruments & measurement books

Advanced scientific computing in BASIC with applications in - download pdf or read online

This e-book offers a realistic advent to numerical equipment and offers uncomplicated subroutines for real-life computations within the components of chemistry, biology, and pharmacology. the alternative of simple because the programming language is stimulated via its simplicity, its availability on all own desktops and by way of its energy in info acquisition.

Energy-dispersive X-ray analysis in the electron microscope - download pdf or read online

This booklet offers an in-depth description of x-ray microanalysis within the electron microscope. it really is sufficiently special to make sure that newbies will comprehend the nuances of high quality EDX research. contains information regarding layout in addition to the physics of x-ray iteration, absorption and detection, and so much post-detection information processing.

New PDF release: Handbook of Biomedical Nonlinear Optical Microscopy

The instruction manual of Biomedical Nonlinear Optical Microscopy presents accomplished therapy of the theories, options, and biomedical functions of nonlinear optics and microscopy for telephone biologists, lifestyles scientists, biomedical engineers, and clinicians. The chapters are separated into uncomplicated and complicated sections, and supply either textual and graphical illustrations of all key options.

New PDF release: Mr. Wizard's experiments for young scientists

The television character brings his classes domestic during this all-time favourite job booklet.

Extra info for Aberration-corrected Analytical Electron Microscopy

Sample text

Beam damage of the specimen can occur by two dominant mechanisms – knock-on damage in which an atom or ion is displaced from its normal site, and ionisation damage (in some contexts called radiolysis) in which electrons are perturbed leading to chemical and then possibly structural changes. Both mechanisms are discussed by Williams and Carter (2009) and also Egerton et al. (2004), who give a chart showing the ranges of primary beam energy which are likely to cause displacement damage for specific atomic species.

Such an ambitious programme has not yet been carried out in practice, for a variety of reasons. But it is instructive to think of the amount of information required. In a particle of size 30 nm, there are typically a million atoms. 1%. The total information required is a minimum of 1016 bits, say 1 Tbyte. Even if the problems of mechanical stability and radiation damage in the microscope could be overcome, the problem of handling the data is formidable, requiring processing speeds and random access memories perhaps a hundred times greater than those now routinely available.

The ideal specimen must be thin enough that: • it can be treated as a weak phase object (see below); • electron beam spreading within the specimen is negligible; • (if a nano-particle) it can be supported on a thin substrate with the total thickness still small enough to satisfy the two constraints listed above; GENERAL INTRODUCTION-TRANSMISSION ELECTRON MICROSCOPY 15 . . e. low noise or high enough signal to noise ratio) images or spectra. These requirements imply that, for most materials to be imaged or analysed at atomic-column resolution, the appropriate thickness will lie in the range up to 50 nm.

Download PDF sample

Aberration-corrected Analytical Electron Microscopy by Rik Brydson

by Mark

Rated 4.29 of 5 – based on 3 votes